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mmmmmx521

Main features:

• Multiple displays can be analyzed at once

• Generate user-defined AOI patterns

• Highlight the minimum and maximum brightness point locations

• Freely edit uniformity results

• DFF point scanning uniformity

• Fast measurement



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Specification
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The uniformity of brightness and chromaticity are important performance indicators for displays and backlights. Usually the test grid in the display area is fixed to measure the uniformity. Uniformity analysis kit makes uniformity analysis simple and fast

-Define simple or very complex area of interest (AOI) arrays

-Automatically apply AOI to measurement

-Calculate uniformity

The software automatically updates the AOI array for each measurement, without the need for high-precision fixture assistance. Support irregularly shaped displays.