LIV test system-Shanghai Hengse Optoelectronics Technology Co., Ltd.

LIV test function characteristics

1. Powerful software analysis function, can scan and measure LIV curve, PCE curve, temperature-peak wavelength-optical power curve, can set scanning accuracy and speed, can measure photoelectric conversion efficiency, and automatically save test data

2. High-precision optical resolution spectrometer spectral range 400-1100nm optional, spectral resolution 0.1nm, achieve spectral peak wavelength and full width at half maximum (FWHM) measurement, can achieve 2kHz sampling rate, can scan measurement temperature-peak wavelength-power curve Wait

3. Manual or automatic probe platform, which can realize automatic LIV spectral power test of wafer or module

4. The temperature of the sample can be accurately controlled, the scanning step can be set, high-speed synchronous triggering can be realized, and the measurement can be preset/customized

5. Multi-thread combination (high-power high-precision current source, high-precision high-speed digital multimeter, multi-channel synchronous digital multimeter, power probe, spectrometer, temperature controller, etc.), can realize the program of spectrum, power, current, temperature and other parameters Scanning and measurement

6. Integrated industrial control cabinet, high-resolution LCD display, automatic integrated operating software

7. The four-wire measurement method is used to record the measured current, voltage and power values in real time, making the test more accurate

8. The program can be set to continuous and pulse scan two modes

9. Life aging detection function: under constant or pulse conditions (current, temperature), test and record spectrum and power data at intervals

Describe

Specification

Documents and downloads

The goal of LIV testing

LIV (or PIV) is a test widely used for performance evaluation of optoelectronic materials, chips, and devices.

In most cases, in the LIV test environment, in addition to optical power, current, and voltage tests, designers and testers will also use the built system to add temperature control and spectrum measurement items. Through calculation and data/image processing of the optical power, excitation current/voltage, spectrum, and temperature changes of these DUTs, many key parameters and graphs can be obtained, including:

Direct parameters

The measured values that can be read or obtained directly, such as: working voltage; working current; optical power (calibration parameters through the photocurrent of the detector); backlight current (if there is a backlight detector); peak wavelength; side mode suppression ratio; temperature, etc.

Indirect parameter

Need to calculate and analyze the laser parameters, such as: threshold current; output Kink (non-linear); slope efficiency; conversion efficiency; half-height width; equivalent resistance; junction temperature, etc.

Visual chart

Including: LIV curve (including PI, IV, I-conversion efficiency, etc.); wavelength-I curve; wavelength-temperature curve; power-temperature curve; working voltage-temperature curve; other required multi-dimensional views, etc.